RFID-based monitoring | IDAC https://www.tuhh.de/idac/de/research/rfid-based-monitoring
Testing (BAM) Division 8.1 – Sensors, Measurement and Testing Methods Unter den Eichen
Testing (BAM) Division 8.1 – Sensors, Measurement and Testing Methods Unter den Eichen
PhD Student Office: Federal Institute of Material Research and Testing, Unter den Eichen
PhD Student Office: Federal Institute of Material Research and Testing, Unter den Eichen
3D-Objekt-Modellierung und -Erkennung dynamischer Vorgänge Literatur Adameck, M., Hossfeld, M., Eich
Yu., Eich, M., Störmer, M., Iridium Based Selective Emitters for Thermophotovoltaic
Manfred Eich Institutsleiter O 3.024 040/42878-3147 m.eich(at)tuhh(dot)de Oberingenieur
Eich Dr. A. Petrov M.Sc. H.
Eich, “Integrating cell on chip—novel waveguide platform employing ultra-long
.; and Eich, M.; Thermal radiation transmission and reflection properties of ceramic